Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003

Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium : SEMI-THERM proceedings 2003 : San Jose, CA, USA, March 11-13, 2003

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Bibliographic Details
Corporate Authors:	IEEE Semiconductor Thermal Measurement and Management Symposium (Corporate Author), IEEE Semiconductor Thermal Measurement and Management Symposium San Jose, Calif., IEEE Components, Hybrids, and Manufacturing Technology Society (Content Provider), IEEE Xplore (Online service)
Format:	Conference Proceeding Book
Language:	English
Published:	Piscataway, N.J. : IEEE, [2003] [Place of publication not identified] IEEE 2003
Subjects:	Semiconductors > Cooling > Congresses Semiconductors > Thermal properties > Congresses Electrical & Computer Engineering Electrical Engineering Engineering & Applied Sciences Semiconductors > Cooling Semiconductors > Thermal properties Conference papers and proceedings
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Duke University

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Call Number:	621.38152 I22, F781