Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) /

Properties of material in the submillimeter wave region (instrumemtation and measurement of index of refraction) /

Show other versions (1)

Attenuators; beam splitters; carbon dioxide lasers; dielectric properties; Mach-Zehnder interferometers; reflectance; submillimeter waves

Saved in:
Bibliographic Details
Main Authors: Lally, J. (Author), Meister, R. (Author)
Corporate Author: United States National Aeronautics and Space Administration (sponsoring body.)
Format: Government Document Book
Language:English
Published: [Washington, District of Columbia] : Department of Electrical Engineering, Catholic University of America : National Aeronautics and Space Administration, 11 July 1983
Series:NASA contractor report NASA-CR-175156
Subjects:
Refractive index > Measurement
Submillimeter waves
Attenuators
Beam splitters
Carbon dioxide lasers
Dielectric properties
Mach-Zehnder interferometers
Tags: Add Tag
No Tags, Be the first to tag this record!

Internet

This item is not available through BorrowDirect. Please contact your institution’s interlibrary loan office for further assistance.

Stanford University

Holdings details from Stanford University
Call Number: ISIL:US-CST
NAS 1.26:175156

Similar Items