Applied logistic regression /

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Bibliographic Details
Main Author: Hosmer, David W
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, [1989], ©1989
New York : c1989
New York : ©1989
New York : c1989
New York : [1989]
Series:Wiley series in probability and mathematical statistics Applied probability and statistics
Wiley series in probability and mathematical statistics Applied probability and statistics
Wiley series in probability and mathematical statistics Applied probability and statistics.
Wiley series in probability and mathematical statistics
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Call Number: QA278.2 .H67 1989

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