Suppression of premature dielectric breakdown for high-voltage capacitance measurements /
Saved in:
| Main Author: | |
|---|---|
| Format: | Government Document Book |
| Language: | English |
| Published: |
Washington :
The Bureau : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,
1977
Washington : 1977 |
| Series: | NBS special publication
400-37 Semiconductor measurement technology NBS special publication ; 400-37 NBS special publication 400-37. Semiconductor measurement technology |
| Subjects: | |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|