Lifetime and diffusion length measurements on silicon material and solar cells /

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Bibliographic Details
Main Author: Othmer, Siegfried
Corporate Authors: United States Department of Energy, Jet Propulsion Laboratory (U.S.), Northrop Research and Technology Center
Other Authors: Chen, Susan C
Format: Government Document Book
Language:English
Published: [Washington] : Springfield, Va. ; Dept. of Energy ; for sale by the National Technical Information Service, 1979-
Series:DOE/JPL ; 954614-1
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Call Number: E 1.28:DOE/JPL/954614-1