Dymanic response assessment for the MEMS accelerometer under severe shock loads /

Dymanic response assessment for the MEMS accelerometer under severe shock loads /

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Bibliographic Details
Main Author: Fan, Mark S
Corporate Author: Goddard Space Flight Center
Other Authors: Shaw, Harry C
Format: Government Document Book
Language:English
Published: Greenbelt, Md. : Hanover, MD : National Aeronautics and Space Administration, Goddard Space Flight Center : Available from NASA Center for AeroSpace Information, [2001]
Series:NASA technical paper 209978
Subjects:
Accelerometers > Testing
Materials > Dynamic testing
Microelectromechanical systems
Shock (Mechanics)
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Stanford University

Holdings details from Stanford University
Call Number: TL589.2 .A3 2001

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