Optical inspection and micromeasurements : 10-14 June 1996 Besancon, France
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| Corporate Authors: | , , |
|---|---|
| Other Authors: | |
| Format: | Book |
| Language: | English |
| Published: |
Bellingham :
SPIE,
1996
Bellingham, Wash. : [1996], ©1996 Bellingham, Wash. : c1996 |
| Series: | Europt Proceedings Series
Proceedings of SPIE--the International Society for Optical Engineering v. 2782 Europto series Proceedings of SPIE--the International Society for Optical Engineering ; v. 2782 |
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