Fabrication, testing, and reliability of semiconductor lasers /
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| New Title: | Testing, packaging, reliability and applications of semiconductor lasers |
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| Corporate Author: | |
| Format: | Serial |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c1996-
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| Series: | Proceedings of SPIE--the International Society for Optical Engineering
v. 2683, v. 3004, v. 3285 |
| Subjects: | |
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| Call Number: |
TA1505 .P76 V.2683 SUB 1ST 1996 TA1505 .P76 V.3004 SUB 2ST 1997 TA1505 .P76 V.3285 SUB 3RD 1998 |
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