Fabrication, testing, and reliability of semiconductor lasers /

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Bibliographic Details
New Title:Testing, packaging, reliability and applications of semiconductor lasers
Corporate Author: Society of Photo-optical Instrumentation Engineers
Format: Serial
Language:English
Published: Bellingham, Wash., USA : SPIE, c1996-
Series:Proceedings of SPIE--the International Society for Optical Engineering v. 2683, v. 3004, v. 3285
Subjects:
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Description
Published:[1] (31 Jan.-1 Feb. 1996)-
Ceased with 3 (1998)
Physical Description:3 v. : ill. ; 28 cm
Publication Frequency:Annual