Fabrication, testing, and reliability of semiconductor lasers /
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| New Title: | Testing, packaging, reliability and applications of semiconductor lasers |
|---|---|
| Corporate Author: | |
| Format: | Serial |
| Language: | English |
| Published: |
Bellingham, Wash., USA :
SPIE,
c1996-
|
| Series: | Proceedings of SPIE--the International Society for Optical Engineering
v. 2683, v. 3004, v. 3285 |
| Subjects: | |
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| 245 | 0 | 0 | |a Fabrication, testing, and reliability of semiconductor lasers / |c sponsored and published by SPIE--The International Society for Optical Engineering |
| 260 | |a Bellingham, Wash., USA : |b SPIE, |c c1996- | ||
| 300 | |a 3 v. : |b ill. ; |c 28 cm | ||
| 310 | |a Annual | ||
| 362 | 0 | |a [1] (31 Jan.-1 Feb. 1996)- | |
| 362 | 1 | |a Ceased with 3 (1998) | |
| 490 | 1 | |a Proceedings / SPIE--the International Society for Optical Engineering ; |v v. 2683, v. 3004, v. 3285 | |
| 596 | |a 31 | ||
| 650 | 0 | |a Semiconductor lasers |x Design and construction |x Congresses | |
| 710 | 2 | |a Society of Photo-optical Instrumentation Engineers | |
| 785 | 0 | 0 | |t Testing, packaging, reliability and applications of semiconductor lasers |
| 830 | 0 | |a Proceedings of SPIE--the International Society for Optical Engineering |v v. 2683, v. 3004, v. 3285 | |
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